Welcome to Silicon Frontline.
Unparalleled leadership in Power Device Analysis and IR Drop & EM Analysis
- Power Device Analysis: Rdson calculation, Current Density & IR Drop Analysis, EM Verification, Gate delay Analysis, transient operation of power device and full chip, Transient Electro-thermal Analysis
- IR Drop & EM Analysis: Resistance Mapping highlights weak points in networks, point to point resistance, Pre and Post LVS analysis, Static and dynamic analysis capabilities, Extremely simple set-up
Key Performance in ESD Analysis and Parasitic Extraction
- ESD Analysis: Chip level Analysis providing HBM, CDM and MM support, Supports TLP measurements, Highlights non-esd device failures, Reports voltage, current density and resistances for all ESD events
- Parasitic Extraction: Guaranteed Accurate parasitic extraction, user controlled accuracy achievable, Full chip capacity, Supports standard design flows, Supports Manufacturing Effects, Provides distributed Extraction
A Powerful Suite of Analysis and Extraction Tools
The tools designed by Silicon Frontline resolve your issues accurately and efficiently, with leading-edge performance and capacity required by today's sophisticated designs.
- R3D: resistive 3D extraction and analysis
- R3D Gate: analyzes and optimizes transient impact of gate networks
- Ethan: full chip electro-thermal simulation of power devices
- P2P: point-to-point IR drop analysis
- ESRA: full chip ESD analysis
- F3D: fast 3D extraction