P2P

IR Drop and EM Analysis, Point to Point Resistance and Resistance Mapping

P2P provides:

  • Interconnect extraction & analysis to facilitate robust power nets
  • Usable throughout the physical design process:
    • During early physical design (architecture/partitioning)
    • At post-layout verification
    • Can be applied to blocks or full-chip
  • Flexible, with multiple modes of analysis:
    • Resistance mapping – qualitative view

      Resistance map of all metal layers showing areas of high resistance in red

      Resistance map of all metal layers showing areas of high resistance in red

    • Static IR Drop/EM analysis – qualitative or quantitative view

      Voltage distribution in ground net

      Voltage distribution in ground net

  • Powerful
    • Unlimited capacity
    • Fast (from minutes to hours, depending on circuit & analysis type)
    • No perturbation to existing design flows; easy to setup and use
      • For new or occasional users
      • Power easily available for expert users